"Q-PLUS consistently provides concise and accurate data in a timely manner."
"I was very satisfied with the level of quality and customer service we received from Q-PLUS Labs and will definitely use them again."
"One positive aspect of working with Q-PLUS is their level of experience and their intimate knowledge of the inspection process and industry requirements."
"Our company has benefited greatly from service and consultation expertise offered by Q-PLUS. Time saved through outsourcing our QC-protocol trial runs has helped enormously toward meeting our product feasibility goals. Q-PLUS employees are cordial, competent, and readily available to discuss project details necessary when carrying out prototype research and development."
Dr. Michael C.
Advanced Resonance Technologies
"It's always great to have an outside inspection lab to go to that can and will work with me and accommodate my needs in a sane, rational and common sense manner. You guys do good work and I shall always have Q-Plus as a resource…..and shall spread the word."
"Your teamwork, dedication, and consistent ability to meet your commitments is very much appreciated. Knowing that we could depend on your delivery day/time, helped us build confidence in the delivery plan and meet our commitments to our customer. Please pass on our appreciation to your team."
Wed, 02/08/2017 - 00:47 — hannahl
February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission
Tue, 01/17/2017 - 16:44 — hannahl
January 2017: Q-PLUS Labs expands its extensive nano measurement capabilities with the introduction of a new laser confocal microscope for non-contact measurement. Using supremely high accuracy laser scanning, this system is extremely versatile and able to perform color profilometry as well as precise measurements down to .5 nanometers (500 picometers)! The system's speed of data acquisition has an incredibly fast response time and can characterize surfaces for accurate measurement results with high-resolution and low noise on a variety of objects, even almost to the "equator" on difficult to measure spherical shapes! Click here to request a quote.
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