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Join Q-PLUS Labs at Space Tech Expo 2016

May 2016: Join Q-PLUS Labs as we exhibit at Booth #1028 at Space Tech Expo 2016 at the Pasadena Convention Center in Pasadena, CA - May 24-26. Space Tech Expo offers the widest showcase of space-related technologies used in the design, build and testing of spacecraft, satellite and launch vehicles. Click here for Free Exhibit Hall Admission.

SpaceTech Expo Free Exhibits

Recent News

Q-PLUS Labs' Service Spotlight: CT Scanning Services

March 2017: Did you know that Q-PLUS Labs has significant CT Scanning capabilities, specifically tailored to your application? For dimensional inspection, testing, or reverse engineering, our lab has the expertise to accurately measure large or small sized parts and assemblies. We provide high quality CT Scanning data, post processed into the information or results that you need (such as inspection reports or 3D CAD models). We are experienced in tackling projects with parts or assemblies containing many internal features, even those where nondestructive inspection is mandatory in order to gain access for conventional measurement or for other uses such as imaging and failure analysis. Click here to request a quote.

CT Scanning Service

2017 MD&M West

February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission

MD&M West 2017

Q-PLUS Labs’ Nano Measurement Arsenal Expands with New Laser Confocal System

January 2017: Q-PLUS Labs expands its extensive nano measurement capabilities with the introduction of a new laser confocal microscope for non-contact measurement. Using supremely high accuracy laser scanning, this system is extremely versatile and able to perform color profilometry as well as precise measurements down to .5 nanometers (500 picometers)! The system's speed of data acquisition has an incredibly fast response time and can characterize surfaces for accurate measurement results with high-resolution and low noise on a variety of objects, even almost to the "equator" on difficult to measure spherical shapes! Click here to request a quote.