Q-PLUS Labs Expands Nano Measurement Capabilities
IRVINE, CA, April 30, 2014
Q-PLUS Labs' nano measurement capabilities expand with the introduction of the cyberSCAN CT 300 from cyberTECHNOLOGIES. Mike D. Knicker, President of Q-PLUS Labs, Inc. was impressed that the machine met the company's high standards: "I initially greeted the CT 300 with the same healthy skepticism I have with all new systems, but after subjecting it to intense scrutiny and robust trials, it proved to have the capabilities we were looking for."
The high resolution, non-contact, 3D measurement system's scanning can be configured with a confocal laser, chromatic white light sensor, and white light interferometry which offer fast, precise, and accurate measurements on small and large samples. The CT 300's ability to measure large samples up to the size of the machine's 315mm x 315mm x 150mm travel area, as well as extremely small samples comes from its powerful sensors which possess a z-resolution down to 3 nanometers and a measurement range up to 25mm.
With this level of accuracy, the machine is able to solve difficult processes to measure the coplanarity or points lying in the same geometric plane. It precisely measures irregular textures such as bumps which normally consist of highly reflective material, usually tough to measure for an optical system, and etches, which create an obstacle to measure for traditional 3D-systems.
The CT 300's flexible capabilities make it extremely useful for parts such as orthodontic brackets because the system offers a powerful solution for acquiring data in terms of the amount and degree of 3D geometry for small and miniscule sized objects, significantly filling the void between CMMs possessing tactile sensors and vision systems utilizing non-contact conventional optics.
High accuracy across the entire travel allows for the measurements of PV solar cells, epoxy-film, or other printed and dispensed features as well as larger parts such as wafers, gaskets, or glass lenses to be inspected rapidly and precisely. The CT 300's software can handle up to 10,000 x 10,000 data points in one scan, and the machine has a data collection rate of up to 4 kHz, which efficiently minimizes the amount of inspection time.
"We wanted to enhance the ability to measure small objects with exceptionally high accuracy regardless of reflectivity or translucence. After what amounts to over a year of ongoing research, we expect the CT 300 to greatly expand and improve our 3D nano-scanning and surface profilometry capabilities," said Mr. Knicker about the newest addition to Q-PLUS Labs' impressive metrology arsenal.
For additional information on the system's complete capabilities, as well as Q-PLUS Labs and its wide array of dimensional measurement services, visit the company's website at www.qpluslabs.com, or call 949-380-7758.
Thu, 03/02/2017 - 14:21 — hannahl
March 2017: Did you know that Q-PLUS Labs has significant CT Scanning capabilities, specifically tailored to your application? For dimensional inspection, testing, or reverse engineering, our lab has the expertise to accurately measure large or small sized parts and assemblies. We provide high quality CT Scanning data, post processed into the information or results that you need (such as inspection reports or 3D CAD models). We are experienced in tackling projects with parts or assemblies containing many internal features, even those where nondestructive inspection is mandatory in order to gain access for conventional measurement or for other uses such as imaging and failure analysis. Click here to request a quote.
Wed, 02/08/2017 - 00:47 — hannahl
February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission
Tue, 01/17/2017 - 16:44 — hannahl
January 2017: Q-PLUS Labs expands its extensive nano measurement capabilities with the introduction of a new laser confocal microscope for non-contact measurement. Using supremely high accuracy laser scanning, this system is extremely versatile and able to perform color profilometry as well as precise measurements down to .5 nanometers (500 picometers)! The system's speed of data acquisition has an incredibly fast response time and can characterize surfaces for accurate measurement results with high-resolution and low noise on a variety of objects, even almost to the "equator" on difficult to measure spherical shapes! Click here to request a quote.
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