Contour Analysis 2D & 3D
- Model Based Definition
- Part-to-CAD Comparisons
- Vector-Driven Key Features
- 3D Best-Fit
- Vane & Blade Specialists
Modern product definition is commonly achieved by means of a 3D CAD model. This is particularly important where complex, non-prismatic, free-form or organic geometry exists, as conventional dimensioning is not feasible.
Q-PLUS is fully conversant with Model Based Definition. Unusual shaped geometry requires unusual verification techniques. We have a wide array of special equipment, software and techniques to properly analyze 2D and 3D contours. Our methods both qualify and quantify the results.
Q-PLUS provides innumerable application-specific solutions ranging from abbreviated vector-driven key features inspections to extremely comprehensive part-to-CAD comparisons using high-density scan data. Such analyses can be best-fit using a number of algorithms to achieve “by-the-book” results for complex profile requirements.
Recent News
ASQ WORLD CONFERENCESat, 05/12/2012 - 13:35 — davidzknickerMay 2012: Q-PLUS Labs to exhibit Services and Products during the 2012 ASQ World Conference at the Anaheim Convention Center on May 21nd-23rd (Booth 718). Register Now!
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Del Mar Electronics 2012Sat, 04/14/2012 - 12:21 — davidzknickerApril 2012: Q-PLUS Labs to exhibit Services and Products during the 2012 Del Mar Electronics show located at the Del Mar Fairgrounds in San Diego on May 2nd-3rd (Booth 745). Register Now!
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WESTEC 2012Sat, 03/03/2012 - 14:03 — davidzknickerMarch 2012: Q-PLUS Labs to exhibit Services and Products at the 2012 Westec trade show at the Los Angeles Convention Center on March 27-29 (Booth 1855). Register Now!
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