Q-PLUS is the leading precision dimensional measurement laboratory that, since 1987, has provided a one-stop, under-one-roof solution to all of your precision measurement, inspection, engineering, 3D scanning, modeling & quality-related needs. Q-PLUS is ISO 9001 registered and ISO 17025 accredited as well as a long-time member of the American Society for Quality (ASQ). All measurements performed are traceable to the National Institute of Standards and Technology (N.I.S.T.).
Our dimensional measurement lab specialists are the most demanding of all when it comes to measurement & inspection equipment they use. We put this expertise to work for you to help specify, purchase, setup, integrate and validate the measurement and inspection equipment you need.
Q-PLUS is a premier full service precision dimensional measurement laboratory providing a wide array of quality measurement services and solutions.
Q-PLUS is one of the most well equipped and uniquely capable independent precision dimensional measurement laboratories in the world. We utilize a wide array of precision measurement and inspection equipment including automated capabilities. We also provide portable, on-site measurement solutions.
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Wed, 02/08/2017 - 00:47 — hannahl
February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission
Tue, 01/17/2017 - 16:44 — hannahl
January 2017: Q-PLUS Labs expands its extensive nano measurement capabilities with the introduction of a new laser confocal microscope for non-contact measurement. Using supremely high accuracy laser scanning, this system is extremely versatile and able to perform color profilometry as well as precise measurements down to .5 nanometers (500 picometers)! The system's speed of data acquisition has an incredibly fast response time and can characterize surfaces for accurate measurement results with high-resolution and low noise on a variety of objects, even almost to the "equator" on difficult to measure spherical shapes! Click here to request a quote.
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