Mainstream metrology has gradually outgrown the limits of the "micro" and is increasingly expanding into the realm of the "nano" for advanced microscopy and analysis. With the advent of nano technologies and growing demand for micro manufacturing the need for the ability to accurately measure very small objects and geometry has increased the need for microanalysis. Typically surface finish has required the highest precision in dimensional metrology. This continues however the need to characterize surface conditions has steadily moved beyond what conventional surface finish 2D analyzers can measure. While specifications for 3D surface finishes have existed for some time they have been rarely specified in engineering drawings do the inability to easily obtain such measurements.
Q-PLUS Labs provides a variety of nano measurement capabilities and inspection services. In addition to surface finish in 2D and 3D, now very small geometry can be dimensionally characterized and inspected. The technology utilized ranges from stylus profilers to confocal laser microscopy to white light interferometric optical profilometry. Relevant characteristics include flatness, wear, texture, sharpness, and other conditions that can affect functionality but might otherwise not show up in a dataset of conventional metrology measurements.
Practical applications include:
Outputs can range from simple surface finish readings to full 3D analysis. Obtained data can also be provided in formats ranging from a point cloud to fully parametric 3D CAD models.
Fri, 05/10/2013 - 16:29 — davidzknicker
April 2013: Download our latest free guide to understanding Dimensional Inspection! Selecting the Right Dimensional Inspection Equipment.