Dimensional Inspection (also known as: metrology services, validation, verification, product evaluation, contract inspection and layout inspection) is performed to compare the actual condition of a manufactured part or component to the nominal condition as defined by engineering drawings and blueprints, metal or film templates (decreasingly), digital files and 3D CAD models (increasingly), or even a master tool or part.
As there are many ways to establish product definition or to define design, there are even more ways to measure and inspect the actual product manufactured. Being fully cognizant of this, Q-PLUS has amassed and developed an impressive array of state-of-the-art measuring instruments, equipment and technology. This coupled with our staff of highly skilled, trained, and experienced professionals sustain a consistently high-quality yet cost-effective service unmatched in the industry. The end result for you is impartial, unbiased, and comprehensive information you can depend on.
Our expansive environmentally controlled laboratories are amply equipped to handle virtually any inspection need, big or small, with accuracies and measurement resolutions down to mere nanometers. Timely, easy-to-understand results can be provided in a variety of reporting formats including customer-specific formats.
Wed, 02/08/2017 - 00:47 — hannahl
February 2017: Join Q-PLUS Labs at the 2017 MD&M West show at the Anaheim Convention Center in Anaheim, CA - February 7-9. Our booth has moved! Find us upstairs in the Precision Tec area. We will be unveiling a never before seen, cutting-edge, mystery measuring machine! We will also have the industry's leading measurement manufacturers featuring state of the art systems, software, and live demonstrations. Click here for Free Admission
Tue, 01/17/2017 - 16:44 — hannahl
January 2017: Q-PLUS Labs expands its extensive nano measurement capabilities with the introduction of a new laser confocal microscope for non-contact measurement. Using supremely high accuracy laser scanning, this system is extremely versatile and able to perform color profilometry as well as precise measurements down to .5 nanometers (500 picometers)! The system's speed of data acquisition has an incredibly fast response time and can characterize surfaces for accurate measurement results with high-resolution and low noise on a variety of objects, even almost to the "equator" on difficult to measure spherical shapes! Click here to request a quote.
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